Yizi Xing

Diagnosis of Local Spot Defects in Analog Circuits

Ke Huang, Haralampos‐G. Stratigopoulos, S. Mir et al. · IEEE Transactions on Instrumentation and Measurement · 2012 · 54 citations

Fault Diagnosis, Engineering, Analog Design +18

Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs

Liquan Fang, Mohammed Lemnawar, Yizi Xing · Proceedings/Proceedings - International Test Conference · 2006 · 43 citations

Automotive Industry, Engineering, Measurement +23

Defect-oriented testing of mixed-signal ICs: some industrial experience

Yizi Xing · 2002 · 35 citations

Electrical Engineering, Defect-oriented Testing, Engineering +15

Defect Oriented Testing for analog/mixed-signal devices

B. Kruseman, B. Tasić, C. Hora et al. · 2011 · 35 citations

Engineering, Measurement, Mem Testing +19

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example

H. Hashempour, Jos J. Dohmen, B. Tasić et al. · 2011 · 25 citations

Engineering, Mem Testing, Analog Design +25