S. Chou

Transistor variability after CHC and NBTI stress in 90 nm pMOSFET technology

Chia-Heng Tu, S.Y. Chen, Ai-Erh Chuang et al. · Electronics Letters · 2009 · 18 citations

Engineering, Electrical Engineering, Microelectronics +16

Improving breakdown voltage of SiC/Si heterojunction with graded structure by rapid thermal CVD technology

Jun-Dar Hwang, Y.K. Fang, Kuen-Hsien Wu et al. · IEEE Transactions on Electron Devices · 1997 · 11 citations

Engineering, Electrical Engineering, Materials Science +17

Ionization of hole-transporting materials as a method for improving the photovoltaic performance of perovskite solar cells

Yogesh S. Tingare, Chien‐Hsiang Lin, Chaochin Su et al. · Journal of Materials Chemistry A · 2023 · 10 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17