Statistics
Publications
2
Citations
31
H-Index
2
Active since
1983
Affiliations
NEC (Japan)(Current)
Shigehiro Funatsu is an author at NEC (Japan) specializing in design for testability, test generation, and fault modeling.
Publications per year
1983–1985
2
2
A High Level Test Pattern Generation Algorithm.
Masato Kawai, Hideo Shibano, Shigehiro Funatsu et al. · International Test Conference · 1983 · 18 citations
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