Krzysztof Iniewski

Characterization of the Uniformity of High-Flux CdZnTe Material

Matthew C. Veale, P. Booker, Simon P. Cross et al. · Sensors · 2020 · 53 citations · Full text

Semiconductor materials for x-ray detectors

David Pennicard, B. Pirard, Krzysztof Iniewski · MRS Bulletin · 2017 · 50 citations

Semiconductors, Materials Science, Engineering +3

Modeling and Characterization of VCOs with MOS Varactors for RF Transceivers

P. Sameni, Chris Siu, Shahriar Mirabbasi et al. · EURASIP Journal on Wireless Communications and Networking · 2006 · 19 citations · Full text

Electrical Engineering, Engineering, Vlsi Design +13

Simple formulas for analysis of C-V characteristics of MIS capacitor

A. Jakubowski, Krzysztof Iniewski · Solid-State Electronics · 1983 · 12 citations

Electrical Engineering, Mis Capacitor

Process and device requirements for mixed-signal integrated circuits in broadband networking

Krzysztof Iniewski, M. Syrzycki, Sorin P. Voinigescu · Journal of Telecommunications and Information Technology · 2004 · 10 citations · Full text

Engineering, Device Integration, Communication Circuit +19