C.V. Nguyen

Infrared Spectroscopy Study of Microstructures of Poly(silsesquioxane)s

Eui-Kyun Park, H. W. Ro, C.V. Nguyen et al. · Chemistry of Materials · 2008 · 207 citations

Materials Science, Polymer Material, Engineering +13

Determination of pore-size distribution in low-dielectric thin films

David W. Gidley, W. E. Frieze, T. L. Dull et al. · Applied Physics Letters · 2000 · 189 citations · Full text

Engineering, Nanoporous Material, Positron Annihilation Spectroscopy +16

Improved fabrication approach for carbon nanotube probe devices

Ryan Stevens, C.V. Nguyen, Alan M. Cassell et al. · Applied Physics Letters · 2000 · 95 citations · Full text

Multiwall Nanotube Probes, Engineering, Microscopy +20

Peeling Force Spectroscopy:  Exposing the Adhesive Nanomechanics of One-Dimensional Nanostructures

Mark C. Strus, Luis Zalamea, Arvind Raman et al. · Nano Letters · 2008 · 80 citations

Engineering, Nanostructured Surface, Soft Matter +17

Imaging artefacts in atomic force microscopy with carbon nanotube tips

Mark C. Strus, Arvind Raman, Chang‐Soo Han et al. · Nanotechnology · 2005 · 65 citations

Engineering, Microscopy, Mechanical Engineering +19