Steve C. Irick

Using a straightness reference in obtaining more accurate surface profiles from a long trace profiler

Steve C. Irick, Wayne R. McKinney, David L. Lunt et al. · Review of Scientific Instruments · 1992 · 50 citations

Engineering, Astronomy, Instrumentation +14

Future metrology needs for synchrotron radiation grazing-incidence optics

Lahsen Assoufid, O. Hignette, M. Howells et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2001 · 47 citations

Natural Sciences, Physics, Metrology +11

Determining surface profile from sequential interference patterns from a long tracer profiler

Steve C. Irick · Review of Scientific Instruments · 1992 · 27 citations

Engineering, Civil Engineering, Geophysics +17

Two dimensional power spectral density measurements of X-ray optics with the Micromap \ninterferometric microscope

Valeriy V. Yashchuk, Andrew D. Franck, Steve C. Irick et al. · eScholarship (California Digital Library) · 2005 · 25 citations

Natural Sciences, Biomedical Engineering, Biomedical Optics +14

Surface roughness of stainless-steel mirrors for focusing soft x rays

Valeriy V. Yashchuk, Eric M. Gullikson, Malcolm R. Howells et al. · Applied Optics · 2006 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17