Hanqing Xing

High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy

Hanqing Xing, Hanjun Jiang, Degang Chen et al. · IEEE Transactions on Instrumentation and Measurement · 2009 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +17

A fully digital-compatible BIST strategy for ADC linearity testing

Hanqing Xing, Hanjun Jiang, Degang Chen et al. · 2007 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +17

An N>sup<th>/sup<Order Central Symmetrical Layout Pattern for Nonlinear Gradients Cancellation

Xin Dai, Chengming He, Hanqing Xing et al. · 2005 · 20 citations

Engineering, Electrical Engineering, Circuit Theory +13

New layout strategies with improved matching performance

Chengming He, Xin Dai, Hanqing Xing et al. · Analog Integrated Circuits and Signal Processing · 2006 · 11 citations

Management, Design, Design Optimization +8

On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering

Hanqing Xing, Degang Chen, R.L. Geiger · 2008 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +15