Kan Nakayama

Automatic high-precision calibration system for angle encoder (II)

Tsukasa Watanabe, Hiroyuki Fujimoto, Kan Nakayama et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 60 citations

External Rotary Encoder, Engineering, Measurement +17

Automatic high-precision calibration system for angle encoder

Tsukasa Watanabe, Hiroyuki Fujimoto, Kan Nakayama et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 47 citations

Engineering, Measurement, Education +17

Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness

Hiroo Hashizume, Kan Nakayama, Tadashi Matsushita et al. · Journal of the Physical Society of Japan · 1970 · 32 citations

Materials Science, X-ray Crystallography, X-ray Spectroscopy +11

Use of Asymmetric Dynamical Diffraction of X-rays for Multiple-Crystal Arrangements of the (n₁, +n₂)Setting

Kan Nakayama, Hiroo Hashizume, Akio MIYOSHI et al. · Zeitschrift für Naturforschung A · 1973 · 30 citations · Full text

X-ray Crystallography, Engineering, Multiple Asymmetric Diffractions +16

A New Optical Interferometer for Absolute Measurement of Linear Displacement in the Subnanometer Range

Mitsuru Tanaka, Kan Nakayama · Japanese Journal of Applied Physics · 1983 · 30 citations

Optical Materials, Engineering, Measurement +18