Statistics
Publications
1
Citations
52
H-Index
1
Active since
2005
Affiliations
M. Bawedin is an author at Centre National de la Recherche Scientifique specializing in gate oxide degradation, engineering, and electronic materials.
Publications per year
2005–2005
1
1
A new memory effect (MSD) in fully depleted SOI MOSFETs
M. Bawedin, S. Cristoloveanu, J.G. Yun et al. · Solid-State Electronics · 2005 · 52 citations
Engineering, Electrical Engineering, Electronic Materials +13
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