Concepedia

Simon J. Fang

SJ

2

Publications

35

Citations

2

H-Index

1997

Active since

Affiliations

Texas Instruments (United States)(Current)

Simon J. Fang is an author at Texas Instruments (United States) specializing in applied physics, microelectronics, and engineering.

Top concepts

Thin FilmsEngineeringApplied PhysicsMaterial ScienceMicroelectronicsPhysicsTunnelingMicroscopySemiconductorsDevice Modeling

Publications per year

1997–2000

2

Publications

2

Analysis of interface roughness’s effect on metal–oxide–semiconductor Fowler-Nordheim tunneling behavior using atomic force microscope images

Heng-Chih Lin, Ji-Feng Ying, Toshiyaki Yamanaka et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1997 · 23 citations

Engineering, Microscopy, Semiconductor Device +19

Optimization of the Chemical Mechanical Polishing Process for Premetal Dielectrics

Simon J. Fang, Santos Garza, Honglin Guo et al. · Journal of The Electrochemical Society · 2000 · 12 citations

Optical Materials, Engineering, Mechanical Engineering +21

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