Michael Kessler

Charge carrier lifetime degradation in Cz silicon through the formation of a boron-rich layer during BBr₃diffusion processes

Michael Kessler, Tobias Ohrdes, Bettina Wolpensinger et al. · Semiconductor Science and Technology · 2010 · 94 citations

Engineering, Glass Material, Carrier Lifetime +20

The effect of sample edge recombination on the averaged injection-dependent carrier lifetime in silicon

Michael Kessler, Tobias Ohrdes, Pietro P. Altermatt et al. · Journal of Applied Physics · 2012 · 51 citations

Engineering, Optoelectronic Devices, Integrated Circuits +19

Tradeoffs Between Impurity Gettering, Bulk Degradation, and Surface Passivation of Boron-Rich Layers on Silicon Solar Cells

Sieu Pheng Phang, Wensheng Liang, Bettina Wolpensinger et al. · IEEE Journal of Photovoltaics · 2012 · 44 citations

Materials Science, Semiconductors, Electrical Engineering +15

Characterisation and implications of the boron rich layer resulting from open-tube liquid source BBR3 boron diffusion processes

Michael Kessler, Tobias Ohrdes, Bettina Wolpensinger et al. · 2009 · 29 citations

Engineering, Carrier Lifetime, Borophene +16

High-Efficiency Cells From Layer Transfer: A First Step Toward Thin-Film/Wafer Hybrid Silicon Technologies

Rolf Brendel, J. Petermann, Dimitri Zielke et al. · IEEE Journal of Photovoltaics · 2011 · 25 citations

Engineering, Semiconductor Materials, Optoelectronic Devices +19