N.G. Shankar

Defect detection on semiconductor wafer surfaces

N.G. Shankar, Z.W. Zhong · Microelectronic Engineering · 2004 · 174 citations

Electrical Engineering, Wafer Scale Processing, Engineering +7

A real-time print-defect detection system for web offset printing

N.G. Shankar, Nitin Ravi, Z.W. Zhong · Measurement · 2008 · 34 citations

Web Offset, Failure Detection, Automated Inspection +1

A rule-based computing approach for the segmentation of semiconductor defects

N.G. Shankar, Z.W. Zhong · Microelectronics Journal · 2005 · 29 citations

Improved segmentation of semiconductor defects using area sieves

N.G. Shankar, Zhirong Zhong · Machine Vision and Applications · 2006 · 13 citations

Semiconductors, Defect Tolerance, Engineering +5

On-Line Defect Detection in Web Offset Printing

N.G. Shankar, Nitin Ravi, Z.W. Zhong · 2003 · 10 citations

Web Printing System, Machine Vision, Image Analysis +13