Charlotte T. M. Kwok

Author

University of Illinois Urbana-Champaign

Also Known As

Charlotte Kwok, Charlotte T. M. Kwok, Charlotte T.M. Kwok

Publications

201

Citations

H-Index

Concepts

All Affiliations

University of Illinois Urbana-Champaign

About

Charlotte T. M. Kwok is an author at University of Illinois Urbana-Champaign specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	171
2	Applied Physics	6	6	130
3	Electrical Engineering	3	3	51
4	Natural Sciences	2	2	32
5	Chemical Engineering	1	1	41

Charlotte T. M. Kwok

Publications

171

Citations

H-Index

Page 1

	Year	Citations
Control of Defect Concentrations within a Semiconductor through Adsorption Edmund G. Seebauer, Kapil Dev, Michael Y. L. Jung, Physical Review Letters SemiconductorsMaterials ScienceEngineeringPhysicsCrystalline Defects	2006	47
Temperature and time dependence study of single-walled carbon nanotube growth by catalytic chemical vapor deposition Charlotte T. M. Kwok, Brandon J. Reizman, Daniel E. Agnew, Carbon Materials ScienceChemical EngineeringCarbonizationEngineeringCarbon-based Material	2009	41
Interstitial charge states in boron-implanted silicon M. Y. L. Jung, Charlotte T. M. Kwok, Richard D. Braatz, Journal of Applied Physics Device ModelingSemiconductorsElectrical EngineeringIon ImplantationEngineering	2005	28
A method for quantifying annihilation rates of bulk point defects at surfaces Charlotte T. M. Kwok, Kapil Dev, Richard D. Braatz, Journal of Applied Physics Point DefectsPoint Defect ConcentrationsEngineeringPositron Annihilation SpectroscopyBulk Point Defects	2005	22
Mechanistic benefits of millisecond annealing for diffusion and activation of boron in silicon Charlotte T. M. Kwok, Richard D. Braatz, Silke Paul, Journal of Applied Physics EngineeringCubic Boron NitrideSilicon On InsulatorSemiconductor DeviceBorophene	2009	13
Maximum a posteriori estimation of activation energies that control silicon self-diffusion Charlotte T. M. Kwok, Kapil Dev, Edmund G. Seebauer, Automatica EngineeringPhysicsPosteriori EstimationNatural SciencesApplied Physics	2008	10
Defect engineering by surface chemical state in boron-doped preamorphized silicon S. H. Yeong, Madhavi Srinivasan, B. Colombeau, Applied Physics Letters Materials ScienceElectrical EngineeringEngineeringDefect EngineeringPhysics	2007	10

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