Hugues Giovannini - Concepedia

Author

Hugues Giovannini

Also Known As

Giovannini, H., Giovannini, Hugues, H Giovannini, H R Giovannini, H. Giovannini, H. R. Giovannini, H.R. Giovannini, Hughes Giovannini, Hugues Giovannini, Hugues R. Giovannini

134

Publications

1.2K

Citations

H-Index

Concepts

All Affiliations

Institut Fresnel Centre National de la Recherche Scientifique Aix-Marseille Université Centrale Marseille Science et Médecine (France)

About

Hugues Giovannini is an author at Institut Fresnel specializing in engineering, biomedical imaging, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	27	896
2	Medicine	7	7	212
3	Health Sciences	5	5	175
4	Education	3	3	117
5	Natural Sciences	2	2	77

Hugues Giovannini

Publications

Citations

H-Index

Page 1

	Year	Citations
Increasing the angular tolerance of resonant grating filters with doubly periodic structures F. Lemarchand, Anne Sentenac, Hugues Giovannini Optics Letters PhotonicsFilter LinewidthEngineeringOptical PropertiesAngular Tolerance	1998	105
Experimental Demonstration of Quantitative Imaging beyond Abbe’s Limit with Optical Diffraction Tomography Guillaume Maire, Filip Drsek, Jules Girard, Physical Review Letters EngineeringMicroscopyAdvanced ImagingPhase MicroscopyExperimental Demonstration	2009	98
Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm Roland Ayuk, Hugues Giovannini, A Jost, Optics Letters EngineeringMicroscopyExcitation PatternsBiomedical EngineeringSuper-resolution Microscopy	2013	78
Drift correction for scattering measurements Christelle Eyraud, Jean‐Michel Geffrin, Amélie Litman, Applied Physics Letters Drift CorrectionEngineeringSensor ArrayMeasurementEducation	2006	57
Study of the resonant behaviour of waveguide gratings: increasing the angular tolerance of guided-mode filters F. Lemarchand, Anne Sentenac, E. Cambril, Journal of Optics A Pure and Applied Optics	1999	57
Far-field diffraction microscopy at λ/10 resolution Ting Zhang, Charankumar Godavarthi, Patrick C. Chaumet, Optica	2016	52
Validation of a 3D bistatic microwave scattering measurement setup Christelle Eyraud, Jean‐Michel Geffrin, Pierre Sabouroux, Radio Science RadarEngineeringMeasurement SetupPhysicsMeasurement	2008	50
Nanometric Resolution with Far-Field Optical Profilometry Slimane Arhab, Gabriel Soriano, Yi Ruan, Physical Review Letters EngineeringMicroscopyCoherent Gradient SensingMicroscopy MethodOptical Properties	2013	44
Influence of multiple scattering on the resolution of an imaging system: a Cramér-Rao analysis Anne Sentenac, Charles‐Antoine Guérin, Patrick C. Chaumet, Optics Express EngineeringMeasurementLocalizationSuper-resolution ImagingCalibration	2007	39
Extraction of light from sources located inside waveguide grating structures Hervé Rigneault, F. Lemarchand, Anne Sentenac, Optics Letters	1999	37

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