Tomohiro Morishita - Concepedia

Author

Tomohiro Morishita

Asahi Kasei (Japan)

Also Known As

Tomohiro MORISHITA, Tomohiro Morishita, Tomohiro Morishita Tomohiro Morishita

Publications

293

Citations

H-Index

Concepts

All Affiliations

Asahi Kasei (Japan)The University of Tokyo

About

Tomohiro Morishita is an author at Asahi Kasei (Japan) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	233
2	Applied Physics	6	6	209
3	Electrical Engineering	3	3	140
4	Natural Sciences	1	1	28
5	Chemistry	1	1	28

Tomohiro Morishita

Publications

233

Citations

H-Index

Page 1

	Year	Citations
Improve efficiency and long lifetime UVC LEDs with wavelengths between 230 and 237 nm Akira Yoshikawa, R. Hasegawa, Tomohiro Morishita, Applied Physics Express Ultraviolet LightEngineeringAln Single-crystal SubstratesOptoelectronic DevicesLuminescence Property	2020	88
Milliwatt-power sub-230-nm AlGaN LEDs with &gt;1500 h lifetime on a single-crystal AlN substrate with many quantum wells for effective carrier injection Hirotsugu Kobayashi, Kosuke Sato, Yusuke Okuaki, Applied Physics Letters Aluminium NitrideEngineeringOptoelectronic DevicesSemiconductorsElectronic Devices	2023	29
Ultrafast Charge Transfer at TiO<sub>2</sub>/SCN<sup>-</sup> (aq) Interfaces Investigated by Femtosecond Transient Reflecting Grating Method Tomohiro Morishita, Akihide Hibara, Tsuguo Sawada, The Journal of Physical Chemistry B Transient GratingCharge ExcitationsUltrafast Relaxation ComponentEngineeringChemistry	1999	28
High-quality AlN film grown on a nanosized concave–convex surface sapphire substrate by metalorganic vapor phase epitaxy Akira Yoshikawa, T. Nagatomi, Tomohiro Morishita, Applied Physics Letters Aluminium NitrideEngineeringNcc SurfaceCrystal Growth TechnologyMolecular Beam Epitaxy	2017	28
Creep damage modeling based on ultrasonic velocities in copper Tomohiro Morishita, Masahiko Hirao International Journal of Solids and Structures Materials ScienceStress WaveDamage MechanismEngineeringMechanical Engineering	1997	24
High-Sensitivity Temperature Measurement With Miniaturized InSb Mid-IR Sensor Edson Gomes Camargo, Koichiro Ueno, Tomohiro Morishita, IEEE Sensors Journal EngineeringOptoelectronic DevicesPhotovoltaic SystemPhotovoltaicsHigh-sensitivity Temperature Measurement	2007	23
Direct Measurements of Femtosecond Energy Dissipation Processes of Hot Electrons in a Gold Film Akihide Hibara, Tomohiro Morishita, Isao Tsuyumoto, Japanese Journal of Applied Physics Transient GratingEngineeringElectron DiffractionThermal ConductivityGold Thin Film	1999	13

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