D. H. Eaton

The mean dynamic yield strength of copper and low carbon steel at elevated temperatures from measurements of the “mushrooming” of flat-ended projectiles

J.B. Hawkyard, D. H. Eaton, W. Johnson · International Journal of Mechanical Sciences · 1968 · 94 citations

Elevated Temperatures, Engineering, Low Carbon Steel +7

Frequency response of Si–SiO2 interface states on thin oxide MOS capacitors

D. H. Eaton, C. T. Sah · physica status solidi (a) · 1972 · 39 citations

Engineering, Integrated Circuits, Silicon On Insulator +16

THIN-OXIDE MOS CAPACITANCE STUDIES OF FAST SURFACE STATES

W. R. Hunter, D. H. Eaton, C. T. Sah · Applied Physics Letters · 1970 · 24 citations

Semiconductors, Surface Characterization, Electrical Engineering +13

The effects of polarizer ellipticity on ellipsometry measurements

W. R. Hunter, D. H. Eaton, C. T. Sah · Surface Science · 1970 · 21 citations

Engineering, Measurement, Spectroscopy +7

Series equivalent circuit representation of SiO2Si interface and oxide trap states

D. H. Eaton, C. T. Sah · Solid-State Electronics · 1973 · 19 citations