Statistics
Publications
3
Citations
221
H-Index
3
Active since
2004
Tong You is an author at University of Illinois Urbana-Champaign specializing in quantitative trait loci, yield-related trait assessment, and plant breeding genetics.
Publications per year
2004–2023
3
3
Putative Alleles for Increased Yield from Soybean Plant Introductions
Eileen A. Kabelka, B. W. Diers, W. R. Fehr et al. · Crop Science · 2004 · 156 citations
Putative Alleles for Increased Yield from Soybean Plant Introductions
E. A. Kabelka, Brian W. Diers, W. R. Fehr et al. · Crop Science · 2004 · 50 citations
3D-printed sheet jet for stable megahertz liquid sample delivery at X-ray free-electron lasers
Patrick Konold, Tong You, Johan Bielecki et al. · IUCrJ · 2023 · 15 citations · Full text
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