Current-induced resonance and mass determination of a single magnetic domain wall

Eiji Saitoh, Hideki Miyajima, Takehiro Yamaoka, +1

Nature

MagnetismEngineeringPhysicsCurrent-induced ResonanceMass Determination +9

Magnetic‐Pole Flip by Millimeter Wave

Shin‐ichi Ohkoshi, Marie Yoshikiyo, Kenta Imoto, +15

Advanced Materials

EngineeringMagnetic ResonanceEducationSpin WavesMagnetic Sensor +20

Mesoscopic bar magnet based on ε-Fe2O3 hard ferrite

Shin‐ichi Ohkoshi, Asuka Namai, Takehiro Yamaoka, +7

Scientific Reports

Visualizing Local Electrical Properties of Composite Electrodes in Sulfide All-Solid-State Batteries by Scanning Probe Microscopy

Misae Otoyama, Takehiro Yamaoka, Hiroyuki Ito, +4

The Journal of Physical Chemistry C

EngineeringNmc ParticlesLocal Conduction PathsSpm CombinationSulfide All-solid-state Batteries +19

Electric spectroscopy of vortex states and dynamics in magnetic disks

Minori Goto, Hiroshi Hata, Akinobu Yamaguchi, +4

Physical Review B

EngineeringMagnetic ResonanceSpin DynamicElectric SpectroscopyMagnetism +15

Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip

Masatoshi Yasutake, Kazutoshi Watanabe, Sigeru Wakiyama, +1

Japanese Journal of Applied Physics

EngineeringMeasurementMicroscopyMechanical EngineeringEducation +17

Observations of Single Magnetic Domain Wall in Nanomagnet by Magnetic Force Microscopy

Takehiro Yamaoka, Kazutoshi Watanabe, Yoshiharu Shirakawabe, +3

Japanese Journal of Applied Physics

Mfm MeasurementEngineeringNanowiresMicroscopyMagnetic Resonance +15

Current manipulation of a vortex confined in a micron-sized Fe19Ni81 disk

Akinobu Yamaguchi, K. Motoi, Hideki Miyajima, +4

Applied Physics Letters

EngineeringMagnetic ResonanceMagnetismMagnetohydrodynamicsVortex Dynamic +14

Vacuum Magnetic Force Microscopy at High Temperatures: Observation of Permanent Magnets

Takehiro Yamaoka, Hana Tsujikawa, S. Hasumura, +4

Microscopy Today

MagnetismEngineeringPhysicsMicroscopyScanning Probe Microscopy +13

Observation of a Latent Scratch on Chemo-Mechanical Polished 4H-SiC Wafer by Mirror Projection Electron Microscopy

Toshiyuki Isshiki, Masaki Hasegawa, Takahiro Sato, +5

Materials science forum

Materials ScienceMaterials EngineeringEngineeringElectron MicroscopyMicroscopy +13