William E. Packard

Si(100) Surface under an Externally Applied Stress

F. K. Men, William E. Packard, M. B. Webb · Physical Review Letters · 1988 · 230 citations

Natural Sciences, Materials Engineering, Materials Science +17

Low-energy electron diffraction analysis of the Si(111)7×7 structure

S. Y. Tong, H. Huang, Ching‐Ming Wei et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1988 · 218 citations

Natural Sciences, Materials Science, Physics +17

Atomic geometry of Si(111) 7×7 by dynamical low-energy electron diffraction

H. Huang, S. Y. Tong, William E. Packard et al. · Physics Letters A · 1988 · 60 citations

Natural Sciences, Materials Science, Physics +14

Si(110)-16×2 and Si(110)-5×1 surface reconstructions: Stretched-hexagon face-centered adatom model

William E. Packard, John D. Dow · Physical review. B, Condensed matter · 1997 · 60 citations

Natural Sciences, Materials Engineering, Materials Science +14

Scanning tunneling microscope tip structures

Ruth Nicolaides, Yong Liang, William E. Packard et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1988 · 39 citations

Natural Sciences, Materials Engineering, Materials Science +15