Mehadi Aman

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Active since

2021

Affiliations

National Archives and Records Administration(Current)

Mehadi Aman is an author at National Archives and Records Administration specializing in device reliability, cmos reliability, and pixel architecture.

Publications per year

2021–2022

Publications

Reliability improvement of IGZO‐TFT in hybrid process with LTPS

Mehadi Aman, Yujiro Takeda, Kazuatsu Ito et al. · Journal of the Society for Information Display · 2021 · 37 citations

Engineering, Electrical Engineering, Materials Science +17

Advanced hybrid process with back contact IGZO‐TFT

Masatomo Honjo, Yujiro Takeda, Mehadi Aman et al. · Journal of the Society for Information Display · 2022 · 12 citations

Engineering, Electrical Engineering, Materials Science +17

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