Joseph Zatarski

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Active since

2020

Affiliations

University of Illinois Urbana-Champaign(Current)

United States Naval Academy

Joseph Zatarski is an author at University of Illinois Urbana-Champaign specializing in device characterization, gate leakage, and gate leakage current.

Publications per year

2020–2021

Publications

Condition Monitoring of SiC MOSFETs Based on Gate-Leakage Current Estimation

Joseph Zatarski, Arijit Banerjee, John S. Donnal · IEEE Transactions on Instrumentation and Measurement · 2021 · 26 citations · Full text

Engineering, Electrical Engineering, Microelectronics +15

Condition Monitoring of SiC MOSFETs Utilizing Gate Leakage Current

Patrick Wang, Joseph Zatarski, Arijit Banerjee et al. · 2020 · 19 citations

Engineering, Electrical Engineering, Microelectronics +16

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