Yue Cong - Concepedia

Author

Yue Cong

Pennsylvania State University

Also Known As

Yue Cong

Publications

454

Citations

H-Index

Concepts

All Affiliations

Pennsylvania State University

About

Yue Cong is an author at Pennsylvania State University specializing in applied physics, engineering, and optical properties.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	385
2	Applied Physics	6	6	385
3	Natural Sciences	2	2	39
4	Chemistry	2	2	39
5	Electrical Engineering	1	1	19

Yue Cong

Publications

452

Citations

H-Index

Page 1

	Year	Citations
Intrinsic stress in diamond films prepared by microwave plasma CVD H. Windischmann, Glenn F. Epps, Yue Cong, Journal of Applied Physics Materials ScienceDiamond-like CarbonMineral PhysicHigh Temperature MaterialsEngineering	1991	262
Optical characterization of a four-medium thin film structure by real time spectroscopic ellipsometry: amorphous carbon on tantalum Yue Cong, IIsin An, K. Vedam, Applied Optics	1991	43
Spectroellipsometry characterization of optical quality vapor-deposited diamond thin films Yue Cong, R. W. Collins, Glenn F. Epps, Applied Physics Letters Materials ScienceDiamond-like CarbonOptical MaterialsEngineeringCrystalline Defects	1991	42
Real time spectroscopic ellipsometry characterization of the nucleation of diamond by filament-assisted chemical vapor deposition R. W. Collins, Yue Cong, Hien V. Nguyen, Journal of Applied Physics Materials ScienceDiamond-like CarbonEngineeringCrystalline DefectsOptical Properties	1992	29
Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy Ilsin An, Yue Cong, N. V. Nguyen, Thin Solid Films Instrumentation ConsiderationsSpectroscopyInstrumentationSpectroscopic PropertyBiophysics	1991	24
Characterization of ion beam-induced surface modification of diamond films by real time spectroscopic ellipsometry Yue Cong, R. W. Collins, R. Messier, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Optical MaterialsEngineeringElectron-beam LithographyOptical PropertiesOptical Diagnostics	1991	23
Ion beam etching of GaAs and GaAs/AlGaAs heterostructures probed in real time by spectroscopic ellipsometry A. R. Heyd, Ilsin An, R. W. Collins, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Optical MaterialsEngineeringElectron-beam LithographyOptoelectronic DevicesElectronic Devices	1991	19
Real time monitoring of filament-assisted chemically vapor deposited diamond by spectroscopic ellipsometry Yue Cong, Ilsin An, Hien V. Nguyen, Surface and Coatings Technology Materials ScienceDiamond-like CarbonEngineeringOptical PropertiesSpectroscopy	1991	10

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