A 380 ps, 9.5 mW Josephson 4-Kbit RAM operated at a high bit yield

S. Nagasawa, Y. Hashimoto, Hideaki Numata, +1

IEEE Transactions on Applied Superconductivity

EngineeringVlsi DesignJosephson 4-Kbit RamBias SputteringEmerging Memory Technology +14

A single flux quantum standard logic cell library

Shinichi Yorozu, Yusuke Kameda, Hirotaka Terai, +3

Physica C Superconductivity

Quantum ScienceEngineeringQuantum ComputingPhysicsQuantum Field Theory +2

High-temperature superconducting edge-type Josephson junctions with modified interfaces

T. Satoh, Mutsuo Hidaka, S. Tahara

IEEE Transactions on Applied Superconductivity

Superconducting MaterialEngineeringSitu Edge FabricationJosephson JunctionsNanoelectronics +14

Measurements of the magnetic penetration depth in YBa2Cu3O7−δ thin films by the microstrip resonator technique

Steven M. Anlage, Hsuan Sze, H. J. Snortland, +5

Applied Physics Letters

Superconducting MaterialEngineeringThin Film Process TechnologyMagnetoresistanceMagnetism +15

High-temperature superconducting edge-type Josephson junctions with modified interface barriers

T. Satoh, Jing Wen, Mutsuo Hidaka, +3

IEEE Transactions on Applied Superconductivity

Superconducting MaterialEngineeringChemical ModificationJosephson JunctionsEdge-type Josephson Junctions +14

MRAM Cell Technology for Over 500-MHz SoC

Noboru Sakimura, Tadahiko Sugibayashi, Takeshi Honda, +5

IEEE Journal of Solid-State Circuits

Non-volatile MemoryCell StructureEngineeringEmerging Memory TechnologyComputer Architecture +17

An integration of all refractory Josephson logic LSI circuit

S. Kosaka, A. Shoji, Masahiro Aoyagi, +6

IEEE Transactions on Magnetics

Lsi ComplexityJosephson JunctionsElectrical EngineeringEngineeringQuantum Computing +12

A 4-kbit Josephson nondestructive read-out RAM operated at 580 psec and 6.7 mW

S. Tahara, I. Ishida, S. Nagasawa, +3

IEEE Transactions on Magnetics

Non-volatile MemoryEngineeringMemory DesignEmerging Memory TechnologyComputer Architecture +14

Atomic structure and composition of the barrier in the modified interface high-Tc Josephson junction studied by transmission electron microscopy

Jianguo Wen, N. Koshizuka, Shōji Tanaka, +3

Applied Physics Letters

EngineeringTransmission Electron MicroscopyBarrier DepositionModified Interface JunctionsSemiconductors +14

High-frequency clock operation of Josephson 256-word×16-bit RAMs

S. Nagasawa, Hideaki Numata, Y. Hashimoto, +1

IEEE Transactions on Applied Superconductivity

Low-power ElectronicsHardware SecurityElectrical EngineeringEngineeringVlsi Design +10