F. Anstotz

Real time surface morphology analysis of semiconductor materials and devices using 4D interference microscopy

P.C. Montgomery, F. Anstotz, Gyasi Johnson et al. · Journal of Materials Science Materials in Electronics · 2007 · 23 citations

Materials Science, Semiconductors, Surface Characterization +10

Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

Audrey Leong‐Hoï, Rémy Claveau, Manuel Flury et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015 · 20 citations

Computed Tomography, Engineering, Microscopy +26

Cmos microsystem for ac current measurement with galvanic isolation

Vincent Frick, Luc Hébrard, Philippe Poure et al. · IEEE Sensors Journal · 2003 · 18 citations

Electrical Engineering, Instrumental Chain, Engineering +14

From superresolution to nanodetection: overview of far field optical nanoscopy techniques for nanostructures

Paul Montgomery, Audrey Leong‐Hoï, F. Anstotz et al. · Journal of Physics Conference Series · 2016 · 12 citations · Full text

Nanoparticles, Optical Materials, Engineering +26

High spatial resolution silicon read-out system for single photon X-ray detection

R. Turchetta, F. Anstotz, Yi-Ming Hu et al. · IEEE Transactions on Nuclear Science · 1994 · 10 citations

X-ray Spectroscopy, Engineering, Efficient X-ray Detection +22