Ryan Huang - Concepedia

Author

Ryan Huang

National Yang Ming Chiao Tung University

Also Known As

Ryan H.-M Huang, Ryan H.-M. Huang, Ryan Huang

Publications

467

Citations

H-Index

Concepts

All Affiliations

National Yang Ming Chiao Tung University Semiconductor Manufacturing International (China)Fudan University

About

Ryan Huang is an author at National Yang Ming Chiao Tung University specializing in computer engineering, engineering, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	148
2	Computer Engineering	7	7	148
3	Medicine	1	1	245
4	Social Sciences	1	1	245
5	Cognitive Science	1	1	245

Ryan Huang

Publications

393

Citations

H-Index

Page 1

	Year	Citations
Distributed and Mixed Information in Monosynaptic Inputs to Dopamine Neurons Ju Tian, Ryan Huang, Jeremiah Y. Cohen, Neuron Cognitive ScienceNeural MechanismSensory NeuroscienceNeurodynamicsComputational Neuroscience	2016	245
A 0.13 µm 8 Mb Logic-Based Cu$_{\rm x}$Si$_{\rm y}$O ReRAM With Self-Adaptive Operation for Yield Enhancement and Power Reduction Xiaoyong Xue, Wenxiang Jian, Jianguo Yang, IEEE Journal of Solid-State Circuits Non-volatile MemoryEngineeringVlsi DesignMemory DesignEmerging Memory Technology	2013	38
CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate Austin C.-C. Chang, Ryan Huang, Charles H.‐P. Wen IEEE Transactions on Very Large Scale Integration (VLSI) Systems EngineeringVlsi DesignError Control TechniqueStatistical FoundationComputer Architecture	2012	34
A Logic Resistive Memory Chip for Embedded Key Storage With Physical Security Yufeng Xie, Xiaoyong Xue, Jianguo Yang, IEEE Transactions on Circuits & Systems II Express Briefs Hardware TrojanNon-volatile MemoryEngineeringInformation SecurityEmerging Memory Technology	2015	25
A low cost and high reliability true random number generator based on resistive random access memory Jianguo Yang, Juan Xu, Bo Wang, Hardware SecurityNon-volatile MemoryElectrical EngineeringEngineeringPseudo-random Sequence	2015	16
Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs Chen-Wei Lin, Ryan Huang, Charles H.‐P. Wen, Hardware SecurityReliabilityElectrical EngineeringReliability EngineeringEngineering	2013	13
Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation Jerry C. Ku, Ryan Huang, Louis Y.-Z. Lin, Ripple CompactionEngineeringTest InflationMem TestingComputer Architecture	2014	11
TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits Sung S.-Y. Hsueh, Ryan Huang, Charles H.‐P. Wen EngineeringVlsi DesignCombinational CircuitsComputer ArchitectureIntegrated Circuits	2014	11

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