Statistics
Publications
2
Citations
62
H-Index
2
Active since
2020
Affiliations
J. Jasse is an author at STMicroelectronics (Italy) specializing in bipolar junction transistor biasing, integrated circuit devices, and automotive microcontrollers.
Publications per year
2020–2022
2
2
BEOL Process Effects on ePCM Reliability
Andrea Redaelli, A. Gandolfo, G. Samanni et al. · IEEE Journal of the Electron Devices Society · 2022 · 14 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17
1–2 of 2