L. L. Tongson

Chloride Ion Penetration of Passive Films on Iron

Oliver J. Murphy, J. O’M. Bockris, Tong E. Pou et al. · Journal of The Electrochemical Society · 1983 · 39 citations

Materials Science, Si L'adsorption Initiale, Chemical Engineering +13

Explosive crystallization of rf-sputtered amorphous CdTe films

S. V. Krishnaswamy, R. Messier, P. Swab et al. · Journal of Electronic Materials · 1981 · 25 citations

Materials Engineering, Materials Science, Engineering +7

Comparative study of chemical and polarization characteristics of Pd/Si and Pd/SiO<i>x</i>/Si Schottky-barrier-type devices

L. L. Tongson, Bruce E. Knox, Thomas E. Sullivan et al. · Journal of Applied Physics · 1979 · 25 citations

Engineering, Polarization Characteristics, Semiconductor Materials +16

Soft x-ray emission and Auger electron spectroscopic study of FeS, Fe0.9S, Fe0.875S, and Fe0.5S

L. A. Marusak, L. L. Tongson · Journal of Applied Physics · 1979 · 23 citations

X-ray Crystallography, Magnetic Properties, X-ray Spectroscopy +20

Si and GaAs SIS Heterostructure Solar Cells Using Spray-Deposited ITO

P. P. Sharma, T. C. Anthony, S. Ashok et al. · Japanese Journal of Applied Physics · 1980 · 16 citations · Full text

Wide-bandgap Semiconductor, Engineering, Ito Layer +16