Ian W. Fletcher

Surface Characterization of Conducting Polymer-Silica Nanocomposites by X-ray Photoelectron Spectroscopy

Shuichi Maeda, Michael Gill, Steven P. Armes et al. · Langmuir · 1995 · 101 citations

Engineering, Conducting Polymer-silica Nanocomposites, Altmetric Attention Score +19

Evidence of specific interaction between ?-glycidoxypropyltrimethoxysilane and oxidized aluminium using high-mass resolution ToF-SIMS

Marie‐Laure Abel, Roger P. Digby, Ian W. Fletcher et al. · Surface and Interface Analysis · 2000 · 98 citations

Engineering, Biological Mass Spectrometry, Organic Chemistry +24

Higher sensitivity secondary ion mass spectrometry of biological molecules for high resolution, chemically specific imaging

Liam A. McDonnell, Ron M. A. Heeren, Robert P.J. de Lange et al. · Journal of the American Society for Mass Spectrometry · 2006 · 68 citations

High Resolution, Engineering, Biological Mass Spectrometry +20

Extended data analysis strategies for high resolution imaging MS: New methods to deal with extremely large image hyperspectral datasets

Leendert A. Klerk, Alexander Broersen, Ian W. Fletcher et al. · International Journal of Mass Spectrometry · 2006 · 61 citations

Data Analysis Strategies, High Resolution, Image Analysis +13

Topography and Field Effects in Secondary Ion Mass Spectrometry – Part I: Conducting Samples

Joanna L. S. Lee, Ian S. Gilmore, M. P. Seah et al. · Journal of the American Society for Mass Spectrometry · 2011 · 45 citations

Engineering, Microscopy, Conducting Samples +21