Surface Characterization of Conducting Polymer-Silica Nanocomposites by X-ray Photoelectron Spectroscopy

Shuichi Maeda, Michael Gill, Steven P. Armes, +1

Langmuir

EngineeringConducting Polymer-silica NanocompositesAltmetric Attention ScoreNanostructured PolymerPolymer Nanocomposites +17

Evidence of specific interaction between ?-glycidoxypropyltrimethoxysilane and oxidized aluminium using high-mass resolution ToF-SIMS

Marie‐Laure Abel, Roger P. Digby, Ian W. Fletcher, +1

Surface and Interface Analysis

EngineeringBiological Mass SpectrometryOrganic ChemistryChemistryMass 71 +22

Higher sensitivity secondary ion mass spectrometry of biological molecules for high resolution, chemically specific imaging

Liam A. McDonnell, Ron M. A. Heeren, Robert P.J. de Lange, +1

Journal of the American Society for Mass Spectrometry

High ResolutionEngineeringBiological Mass SpectrometryBiomedical EngineeringAnalytical Instrumentation +18

Extended data analysis strategies for high resolution imaging MS: New methods to deal with extremely large image hyperspectral datasets

Leendert A. Klerk, Alexander Broersen, Ian W. Fletcher, +2

International Journal of Mass Spectrometry

Data Analysis StrategiesHigh ResolutionImage AnalysisEngineeringMedical Imaging +11

Topography and Field Effects in Secondary Ion Mass Spectrometry – Part I: Conducting Samples

Joanna L. S. Lee, Ian S. Gilmore, M. P. Seah, +1

Journal of the American Society for Mass Spectrometry

EngineeringMicroscopyConducting SamplesIon Beam InstrumentationIon Mobility Spectrometry +19

Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method

Peter J. Cumpson, Naoko Sano, Ian W. Fletcher, +3

Surface and Interface Analysis

Positive secondary ion mass spectrum of poly(methyl methacrylate): a high mass resolution ToF-SIMS study

D. Briggs, Ian W. Fletcher, Nancy M. Gon�alves

Surface and Interface Analysis

EngineeringPositive Sims SpectrumBiological Mass SpectrometryChemistryPolymer Material +15

Rapid multivariate analysis of 3D ToF‐SIMS data: graphical processor units (GPUs) and low‐discrepancy subsampling for large‐scale principal component analysis

Peter J. Cumpson, Ian W. Fletcher, Naoko Sano, +1

Surface and Interface Analysis

EngineeringGraphical Processor UnitsPca Components3D Computer VisionParallel Analysis +16

Carbonation of Hydrous Materials at the Molecular Level: A Time of Flight-Secondary Ion Mass Spectrometry, Raman and Density Functional Theory Study

Giovanni Pesce, Ian W. Fletcher, James P. Grant, +3

Crystal Growth & Design

EngineeringMolecular LevelChemistryHydrous MineralsSpectra-structure Correlation +18

Static secondary ion mass spectrometry investigation of corrosion inhibitor Irgamet ® 39 on copper surfaces treated in power transformer insulating oil

Marco Facciotti, P. S. Amaro, Richard C. D. Brown, +5

Corrosion Science

Corrosion TechnologyCorrosionCopper SurfacesCorrosion Inhibitor IrgametCorrosion Inhibition