David M. Lynch

Characterization of reactively sputtered c-axis aligned nanocrystalline InGaZnO4

David M. Lynch, Bin Zhu, Barnaby D.A. Levin et al. · Applied Physics Letters · 2014 · 47 citations

Natural Sciences, Materials Engineering, Materials Science +14

21.4: Deposition Conditions and HRTEM Characterization of CAAC IGZO

David M. Lynch, Bin Zhu, Barnaby D.A. Levin et al. · SID Symposium Digest of Technical Papers · 2015 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +16

Chemical Etch Rate and X-Ray Structure of Reactive Sputtered c-Axis Aligned Crystalline In_xGa_yZn_zO₄Films

Bin Zhu, David M. Lynch, Chen-Yang Chung et al. · ECS Journal of Solid State Science and Technology · 2015 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17

45.2: Effects of RF Sputtering Parameters and Film Composition on C‐Axis Aligned Crystalline (CAAC) IGZO Films

Bin Zhu, David M. Lynch, Chen‐yang Chung et al. · SID Symposium Digest of Technical Papers · 2015 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +16

Securing Against Insider Attacks

David M. Lynch · Information Systems Security · 2006 · 18 citations

Computing, Cybersecurity, Computer Security +6