A. Kurokawa

Challenge: variability characterization and modeling for 65- to 90-nm processes

H. Masuda, S. Ohkawa, A. Kurokawa et al. · 2006 · 150 citations

Engineering, Computer Engineering, Electrical Engineering +17

Efficient capacitance extraction method for interconnects with dummy fills

A. Kurokawa, Toshiki Kanamoto, Akira Kasebe et al. · 2004 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +17

Dummy Filling Methods for Reducing Interconnect Capacitance and Number of Fills

A. Kurokawa, Toshiki Kanamoto, Tetsuya Ibe et al. · 2005 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +17

Quantitative surface chemical analysis of AuCu alloys with aes

Ryuichi Shimizu, T. Homma, Heizō Tokutaka et al. · Surface and Interface Analysis · 1988 · 32 citations

Natural Sciences, Materials Engineering, Materials Science +14

Evaluation of correction accuracy of several schemes for AES matrix effect corrections

Shigeo Tanuma, T. Sekine, Ryuichi Shimizu et al. · Surface and Interface Analysis · 1990 · 20 citations

Natural Sciences, Materials Engineering, Materials Science +10