Jef Vanlaer

Analysis of smearing-out in contribution plot based fault isolation for Statistical Process Control

Pieter Van den Kerkhof, Jef Vanlaer, Geert Gins et al. · Chemical Engineering Science · 2013 · 96 citations · Full text

Engineering, Computer Engineering, Systems Engineering +12

Dynamic model-based fault diagnosis for (bio)chemical batch processes

Pieter Van den Kerkhof, Geert Gins, Jef Vanlaer et al. · Computers & Chemical Engineering · 2012 · 43 citations · Full text

Engineering, Biological Engineering, Chemical Engineering +14

Contribution plots for Statistical Process Control: Analysis of the smearing-out effect

Pieter Van den Kerkhof, Jef Vanlaer, Geert Gins et al. · 2013 · 37 citations

Engineering, Systems Engineering, Process Control +14

Improving classification-based diagnosis of batch processes through data selection and appropriate pretreatment

Geert Gins, Pieter Van den Kerkhof, Jef Vanlaer et al. · Journal of Process Control · 2015 · 15 citations · Full text

Computing, Chemical Engineering, Data Science +17

The RAYMOND simulation package — Generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms

Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof et al. · Computers & Chemical Engineering · 2014 · 12 citations · Full text

Engineering, Systems Engineering, Process Control +15