Concepedia

Michael Williams

MW

Statistics

Publications

4

Citations

111

H-Index

4

Active since

1966

Affiliations

National Institute of Standards and Technology(Current)

Michael Williams is an author at National Institute of Standards and Technology specializing in engineering, applied physics, and x-ray imaging.

Top concepts

EngineeringSpectroscopyX-ray ImagingApplied PhysicsNatural SciencesX-ray SpectroscopyPhysicsChemistryAtomic PhysicsBiophysics

Publications per year

1966–2011

4

Publications

4

Density of States of Ni: Soft-X-Ray Spectrum and Comparison with Photoemission and Ion Neutralization Studies

J. R. Cuthill, A. J. McAlister, Michael Williams et al. · Physical Review · 1967 · 48 citations

X-ray Spectroscopy, Engineering, Physics +15

Soft X-Ray Spectroscopy of Alloys: TiNi and the Ni–Al System

J. R. Cuthill, A. J. McAlister, Michael Williams · Journal of Applied Physics · 1968 · 28 citations · Full text

X-ray Spectroscopy, Engineering, Ni-m3 Spectrum +16

Computationally efficient bioelectric field modeling and effects of frequency-dependent tissue capacitance

Brian Tracey, Michael Williams · Journal of Neural Engineering · 2011 · 24 citations

Frequency-dependent Tissue Capacitance, Medical Electronics, Engineering +21

Soft X-Ray Spectrum of Ni and Comparison with Photoemission and Ion Neutralization Results

J. R. Cuthill, A. J. McAlister, Michael Williams · Physical Review Letters · 1966 · 11 citations

Ion Neutralization Results, X-ray Spectroscopy, Engineering +8

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