Statistics
Publications
3
Citations
61
H-Index
3
Active since
2000
Affiliations
Siemens (United States)(Current)
Kwok C. Tam is an author at Siemens (United States) specializing in computed tomography, inverse problems, and geometric modeling.
Publications per year
2000–2005
3
3
Guenter Lauritsch, Kwok C. Tam, K. Sourbelle et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 17 citations
Rows per page
1–3 of 3