Kyupil Lee

Evolution of NAND Flash Memory: From 2D to 3D as a Storage Market Leader

Hyun‐Suk Kim, Su-Jin Ahn, Yu Gyun Shin et al. · 2017 · 122 citations

Engineering, Computer Engineering, Computer Systems +16

Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices

Suhyun Kim, Sung-Ho Lee, Yoshifumi Oshima et al. · Applied Physics Letters · 2013 · 61 citations

Engineering, Materials Engineering, Materials Science +17

2.45 e-RMS Low-Random-Noise, 598.5 mW Low-Power, and 1.2 kfps High-Speed 2-Mp Global Shutter CMOS Image Sensor With Pixel-Level ADC and Memory

Min-Woong Seo, Hyun-Yong Jung, Suksan Kim et al. · IEEE Journal of Solid-State Circuits · 2022 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

5.6 A 1/2.65in 44Mpixel CMOS Image Sensor with 0.7µm Pixels Fabricated in Advanced Full-Depth Deep-Trench Isolation Technology

Hyunchul Kim, Jong‐Eun Park, In-Sung Joe et al. · 2020 · 34 citations

Engineering, Electrical Engineering, Optoelectronics +14

Quantitative measurement of strain field in strained-channel-transistor arrays by scanning moiré fringe imaging

Suhyun Kim, Yukihito Kondo, Kyungwoo Lee et al. · Applied Physics Letters · 2013 · 33 citations

Engineering, Electrical Engineering, Materials Engineering +17