Luke Meyer

Mitigating Scatter in Mechanical Properties in AISI 410 Fabricated via Arc-Based Additive Manufacturing Process

Sougata Roy, Benjamin Shassere, Jake K. Yoder et al. · Materials · 2020 · 36 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Strategies for a scalable multi-robot large scale wire arc additive manufacturing system

Alex Arbogast, Andrzej Nycz, Mark Noakes et al. · Additive Manufacturing Letters · 2023 · 28 citations · Full text

Engineering, Manufacturing Engineering, Robotics Engineering +17

Detection of sub-500-μm cracks in multicrystalline silicon wafer using edge-illuminated dark-field imaging to enable thin solar cell manufacturing

Sarah Wieghold, Zhe Liu, Samuel Raymond et al. · Solar Energy Materials and Solar Cells · 2019 · 19 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +17

Crack detection in crystalline silicon solar cells using dark-field imaging

Sarah Wieghold, Ashley E. Morishige, Luke Meyer et al. · Energy Procedia · 2017 · 16 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Design of a Submillimeter Crack-Detection Tool for Si Photovoltaic Wafers Using Vicinal Illumination and Dark-Field Scattering

Zhe Liu, Sarah Wieghold, Luke Meyer et al. · IEEE Journal of Photovoltaics · 2018 · 15 citations · Full text

Engineering, Materials Engineering, Materials Science +16