Peter Z. Takacs

Design Of A Long Trace Surface Profiler

Peter Z. Takacs, Shinan Qian, Jeffrey Colbert · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1987 · 130 citations

Engineering, Measurement, Optic Design +17

Optical constants for thin films of C, diamond, Al, Si, and CVD SiC from 24 Å to 1216 Å

David L. Windt, Webster C. Cash, Marion L. Scott et al. · Applied Optics · 1988 · 105 citations

Specification of surface figure and finish in terms of system performance

E. L. Church, Peter Z. Takacs · Applied Optics · 1993 · 85 citations

Engineering, Microscopy, Computer-aided Design +28

Versatile spectrometer for experiments using synchrotron radiation at wave-lengths greater than 100 nm

John C. Sutherland, E. J. Desmond, Peter Z. Takacs · Nuclear Instruments and Methods · 1980 · 72 citations

Versatile Spectrometer, Synchrotron Radiation Research, Radiation Detection +7

<title>Optimal estimation of finish parameters</title>

E. L. Church, Peter Z. Takacs · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1991 · 72 citations

Parameter Estimation, Engineering, Measurement +19