Fei Su

Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives

Fei Su, Chunsheng Liu, Haralampos‐G. Stratigopoulos · IEEE Design and Test · 2023 · 69 citations · Full text

Engineering, Computer Engineering, Computer Science +17

Functional Criticality Classification of Structural Faults in AI Accelerators

Arjun Chaudhuri, Jonti Talukdar, Fei Su et al. · 2020 · 17 citations

Computing, Computer Engineering, Computer Science +17

Functional Criticality Analysis of Structural Faults in AI Accelerators

Arjun Chaudhuri, Jonti Talukdar, Fei Su et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2022 · 15 citations

Computing, Computer Engineering, Computer Science +17

A PVT-Resilient No-Touch DFT Methodology for Prebond TSV Testing

Sourav Das, Fei Su, Sreejit Chakravarty · 2018 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +12

Trouble-Shooting at GAN Point: Improving Functional Safety in Deep Learning Accelerators

Shamik Kundu, Suvadeep Banerjee, Arnab Raha et al. · IEEE Transactions on Computers · 2023 · 13 citations

Computing, Computer Engineering, Computer Science +14