Simon Pickering

A comparison of the pulsed, lock-in and frequency modulated thermography nondestructive evaluation techniques

Krishnendu Chatterjee, Suneet Tuli, Simon Pickering et al. · NDT & E International · 2011 · 168 citations · Full text

Engineering, Electrical Engineering, Mechanical Engineering +9

Matched excitation energy comparison of the pulse and lock-in thermography NDE techniques

Simon Pickering, Darryl Almond · NDT & E International · 2008 · 166 citations

Engineering, Biomedical Engineering, Biomedical Imaging +12

A new technique to detect defect size and depth in composite structures using digital shearography and unconstrained optimization

G. de Angelis, Michele Meo, D. P. Almond et al. · NDT & E International · 2011 · 163 citations

Engineering, Materials Engineering, Materials Science +15

Long pulse excitation thermographic non-destructive evaluation

Darryl Almond, Stefano Angioni, Simon Pickering · NDT & E International · 2017 · 143 citations · Full text

Engineering, Physics, Radiology +12

An analytical study of the pulsed thermography defect detection limit

D. P. Almond, Simon Pickering · Journal of Applied Physics · 2012 · 115 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17