Yujuan He

Statistics

Publications

Citations

205

H-Index

Active since

2009

Affiliations

China Electronic Product Reliability and Environmental Test Institute(Current)

Chinese Academy of Sciences

Institute of Microelectronics

Xiangtan University

Yujuan He is an author at China Electronic Product Reliability and Environmental Test Institute specializing in semiconductor devices, electrical engineering, and engineering.

Publications per year

2009–2025

Publications

Experimental and simulation studies of radiation‐induced single event burnout in SiC‐based power MOSFETs

Chao Peng, Zhifeng Lei, Ziwen Chen et al. · IET Power Electronics · 2021 · 30 citations · Full text

Engineering, Electrical Engineering, Power Electronics +16

Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs

Chao Peng, Zhifeng Lei, Zhangang Zhang et al. · IEEE Transactions on Nuclear Science · 2022 · 24 citations

Engineering, Electrical Engineering, Power Electronics +14

Hydrogen-Related Recovery Effect of AlGaN/GaN High-Electron-Mobility Transistors Irradiated by High-Fluence Protons

Ziwen Chen, Shaozhong Yue, Chao Peng et al. · IEEE Transactions on Nuclear Science · 2021 · 23 citations

Engineering, Electrical Engineering, Electronic Materials +16

Degradation Behavior and Trap Analysis Based on Low-Frequency Noise of AlGaN/GaN HEMTs Subjected to Radio Frequency Overdrive Stress

Qiang Chen, Yiqiang Chen, Chang Liu et al. · IEEE Transactions on Electron Devices · 2020 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Experiment and simulation on degradation and burnout mechanisms of SiC MOSFET under heavy ion irradiation

Hong Zhang, Hongxia Guo, Zhifeng Lei et al. · Chinese Physics B · 2022 · 17 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

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