Statistics
Publications
1
Citations
13
H-Index
1
Active since
2011
Affiliations
Applied Materials (United States)(Current)
Jim Xu is an author at Applied Materials (United States) specializing in process monitoring, semiconductor metrology, and surface metrology.
Publications per year
2011–2011
1
1
Texture process monitoring in solar cell manufacturing using optical metrology
V. Velidandla, Jim Xu, Zhen Hou et al. · 2011 · 13 citations
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