Hao-Hsiung Lin

Investigation of HfO2 Thin Films on Si by X-ray Photoelectron Spectroscopy, Rutherford Backscattering, Grazing Incidence X-ray Diffraction and Variable Angle Spectroscopic Ellipsometry

Xuguang Luo, Yao Li, Hong Yang et al. · Crystals · 2018 · 90 citations · Full text

Materials Science, Materials Engineering, Chemical Engineering +15

Surface/structural characteristics and band alignments of thin Ga2O3 films grown on sapphire by pulse laser deposition

Hong Yang, Yingda Qian, Chi Zhang et al. · Applied Surface Science · 2019 · 86 citations

Materials Science, Epitaxial Growth, Surface/structural Characteristics +10

Origin of high offset voltage in an AlGaAs/GaAs heterojunction bipolar transistor

Si‐Chen Lee, Jau-Nan Kau, Hao-Hsiung Lin · Applied Physics Letters · 1984 · 76 citations

Electrical Engineering, Engineering, Nanoelectronics +10

Optical and surface properties of 3C–SiC thin epitaxial films grown at different temperatures on 4H–SiC substrates

Bingjun Wang, Junhua Yin, Daihua Chen et al. · Superlattices and Microstructures · 2021 · 19 citations

Materials Science, Different Temperatures, Optical Materials +11

Effects of dispersive two-photon transitions on femtosecond pulse propagation in semiconductor waveguides

C. C. Yang, A. Villeneuve, G. I. Stegeman et al. · Applied Physics Letters · 1993 · 15 citations

Quantum Photonics, Engineering, Semiconductor Waveguides +16