Arnaud Jérôme

EUVI: the STEREO-SECCHI extreme ultraviolet imager

J. P. Wuelser, J. R. Lemen, T. D. Tarbell et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 534 citations

Natural Sciences, Astronomy, Physics +17

Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm

J. Gautier, Franck Delmotte, Marc Roulliay et al. · Applied Optics · 2005 · 80 citations

Natural Sciences, Materials Engineering, Materials Science +17

Ion beam deposited Mo/Si multilayers for EUV imaging applications in astrophysics

Marie-Françoise Ravet, F. Bridou, Xueyan Zhang-Song et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 27 citations

Natural Sciences, Materials Science, Physics +13

Design and performance of two-channel EUV multilayer mirrors with enhanced spectral selectivity

Christophe Hecquet, Franck Delmotte, Marie-Françoise Ravet-Krill et al. · Applied Physics A · 2009 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +8

Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Franck Delmotte, Julia Meyer-Ilse, Farhad Salmassi et al. · Journal of Applied Physics · 2018 · 20 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15