Statistics
Publications
1
Citations
29
H-Index
1
Active since
2003
Affiliations
NEC (Japan)(Current)
Yuko Okada is an author at NEC (Japan) specializing in thin film electrical properties, gate leakage current, and semiconductor physics.
Publications per year
2003–2003
1
1
High mobility MISFET with low trapped charge in HfSiO films
A. Morioka, Hirohito Watanabe, Makoto Miyamura et al. · 2003 · 29 citations
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