Qi Cai

A Novel Method Based on Deep Convolutional Neural Networks for Wafer Semiconductor Surface Defect Inspection

Guojun Wen, Zhijun Gao, Qi Cai et al. · IEEE Transactions on Instrumentation and Measurement · 2020 · 79 citations

Convolutional Neural Network, Semiconductor Wafer, Engineering +17

Integrated physics-oriented statistical modeling, simulation, and optimization (MESFETs)

J.W. Bandler, R.M. Biernacki, Qi Cai et al. · IEEE Transactions on Microwave Theory and Techniques · 1992 · 52 citations

Engineering, Simulation, Microwave Device Modeling +17

Deep Learning Based Automated Inspection of Weak Microscratches in Optical Fiber Connector End-Face

Shuang Mei, Qi Cai, Zhijun Gao et al. · IEEE Transactions on Instrumentation and Measurement · 2021 · 21 citations

Convolutional Neural Network, Engineering, Feature Detection +18

Rumor Detection with A Novel Graph Neural Network Approach

Tianrui Liu, Qi Cai, Changxin Xu et al. · Academic Journal of Science and Technology · 2024 · 21 citations · Full text

Abuse Detection, Engineering, Machine Learning +20

Application of indoor temperature prediction based on SVM and BPNN

Qi Cai, Wenbiao Wang, Siyuan Wang · 2015 · 15 citations

Built Environment, Support Vector Machine, Neural Network Toolbox +10