Bo Liu

Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors

Yao Guo, Xianlong Wei, Jiapei Shu et al. · Applied Physics Letters · 2015 · 280 citations

Engineering, Electrical Engineering, Materials Science +17

The intrinsic origin of hysteresis in MoS₂field effect transistors

Jiapei Shu, Gongtao Wu, Yao Guo et al. · Nanoscale · 2016 · 172 citations

Engineering, Electrical Engineering, Materials Science +17

Chemical Vapor Deposition of High‐Quality Large‐Sized MoS₂ Crystals on Silicon Dioxide Substrates

Jianyi Chen, Wei Tang, Bingbing Tian et al. · Advanced Science · 2016 · 170 citations · Full text

Engineering, Materials Engineering, Materials Science +16

Temperature-Driven α-β Phase Transformation and Enhanced Electronic Property of 2H α-In₂Se₃

Fengjiao Lyu, Xuan Li, Jiamin Tian et al. · ACS Applied Materials & Interfaces · 2022 · 28 citations

Natural Sciences, Materials Science, Physics +15

Edge‐States‐Induced Disruption to the Energy Band Alignment at Thickness‐Modulated Molybdenum Sulfide Junctions

Yao Guo, Jianbo Yin, Xianlong Wei et al. · Advanced Electronic Materials · 2016 · 19 citations

Engineering, Materials Science, Physics +17