Yao Guo

Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors

Yao Guo, Xianlong Wei, Jiapei Shu et al. · Applied Physics Letters · 2015 · 274 citations

Electrical Engineering, Semiconductor Device, Engineering +12

The intrinsic origin of hysteresis in MoS₂field effect transistors

Jiapei Shu, Gongtao Wu, Yao Guo et al. · Nanoscale · 2016 · 169 citations

Semiconductor Technology, Electrical Engineering, Intrinsic Origin +15

Unravelling Orientation Distribution and Merging Behavior of Monolayer MoS₂ Domains on Sapphire

Qingqing Ji, Min Kan, Yu Zhang et al. · Nano Letters · 2014 · 163 citations

Merging Behavior, Nanosheet, Engineering +19

Distinctive in-Plane Cleavage Behaviors of Two-Dimensional Layered Materials

Yao Guo, Chunru Liu, Qifang Yin et al. · ACS Nano · 2016 · 130 citations

Nanosheet, Engineering, Two-dimensional Materials +16

Study on the Resistance Distribution at the Contact between Molybdenum Disulfide and Metals

Yao Guo, Yuxiang Han, Jiapeng Li et al. · ACS Nano · 2014 · 93 citations

Molybdenum Disulfide, Engineering, Nanosheet +22