Statistics
Publications
2
Citations
105
H-Index
2
Active since
2016
Affiliations
Tiangong University(Current)
Juan Le is an author at Tiangong University specializing in computer vision, machine vision, and pattern recognition.
Publications per year
2016–2021
2
2
Automatic fabric defect detection using a wide-and-light network
Jun Wu, Juan Le, Zhitao Xiao et al. · Applied Intelligence · 2021 · 75 citations
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