Statistics
Publications
1
Citations
33
H-Index
1
Active since
1990
Affiliations
Motorola (United States)(Current)
B.T. Neel is an author at Motorola (United States) specializing in software testing, hardware systems, and integrated circuits.
Publications per year
1990–1990
1
1
Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM
C. Kuo, T. Toms, B.T. Neel et al. · IEEE Journal of Solid-State Circuits · 1990 · 33 citations
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