Statistics
Publications
1
Citations
26
H-Index
1
Active since
1989
Affiliations
Y. H. Lee is an author at IBM Research - Thomas J. Watson Research Center specializing in electrical conductivity measurements, temperature-dependent conductivity, and etch mechanisms.
Publications per year
1989–1989
1
1
Sidewall damage in <i>n</i>+-GaAs quantum wires from reactive ion etching
Rebecca Cheung, Y. H. Lee, C. M. Knoedler et al. · Applied Physics Letters · 1989 · 26 citations
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