Concepedia

Woo‐Sic Kim

WK

4

Publications

70

Citations

4

H-Index

2016

Active since

Affiliations

Pohang University of Science and Technology(Current)

Woo‐Sic Kim is an author at Pohang University of Science and Technology specializing in engineering, applied physics, and electrical engineering.

Top concepts

EngineeringApplied PhysicsElectrical EngineeringThin FilmsNanoelectronicsOptoelectronicsElectronic DevicesElectronic MaterialsOxide Semiconductors

Publications per year

2016–2019

4

Publications

4

Effect of Wavelength and Intensity of Light on a-InGaZnO TFTs under Negative Bias Illumination Stress

Woo‐Sic Kim, Yeol‐Hyeong Lee, Yong‐Jung Cho et al. · ECS Journal of Solid State Science and Technology · 2016 · 25 citations · Full text

Effect of defect creation and migration on hump characteristics of a-InGaZnO thin film transistors under long-term drain bias stress with light illumination

Yong‐Jung Cho, Woo‐Sic Kim, Yeol‐Hyeong Lee et al. · Solid-State Electronics · 2018 · 22 citations

Defect Creation, Electrical Engineering, Engineering +9

Relationship between Detrapping of Electrons and Negative Gate Bias during Recovery Process in a‐InGaZnO Thin Film Transistors

Yun‐Seong Kang, Yeol‐Hyeong Lee, Woo‐Sic Kim et al. · physica status solidi (a) · 2019 · 12 citations

Negative Gate Bias, Semiconductor Technology, Electrical Engineering +14

Abnormal behavior with hump characteristics in current stressed a-InGaZnO thin film transistors

Woo‐Sic Kim, Yong‐Jung Cho, Yeol‐Hyeong Lee et al. · Solid-State Electronics · 2017 · 11 citations

Electrical Engineering, Engineering, Bias Temperature Instability +4

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